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778800-01

The NI PXI-7811R, part 778800-01, is a Virtex-5 FPGA-based PXI R Series device for waveform generation and HIL tests, supported by LabVIEW FPGA.

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    Description

    The product with the part number 778800-01 falls under the category of PXI R Series, specifically model PXI-7811. It is described as the NI PXI-7811R 1M Gate Digital RIO (160 DIO), integrating a Virtex-5 FPGA. This module is programmed using the LabVIEW FPGA environment, making it highly adaptable to various applications.

    It is designed for a wide range of applications including waveform generation, sensor simulation, HIL test, custom communications protocols, and bit error rate test. The architecture of this model includes a six-input Lookup Table (LUT) and DSP48 DSP slices, providing ample flexibility and processing power for handling complex tasks and simulations.

    Despite its obsolete status, announced by National Instruments, it remains available for purchase and repairs through Apex Waves. This ensures continued support for users relying on this advanced module for their critical projects and applications.

    Specification Detail
    Part Number 778800-01
    Category PXI R Series
    Model PXI-7811
    Description NI PXI-7811R 1M Gate Digital RIO (160 DIO)
    FPGA Virtex-5
    Programming Environment LabVIEW FPGA
    Applications Waveform generation, sensor simulation, HIL test, custom communications protocols, bit error rate test
    Lookup Table (LUT) Six-input
    DSP Slices DSP48
    Obsolete Status Announced by National Instruments, available for purchase and repairs by Apex Waves

    Question 1: What is the part number for the PXI-7811?
    Answer 1: 778800-01

    Question 2: Which FPGA is used in the PXI-7811?
    Answer 2: Virtex-5 FPGA

    Question 3: Can the PXI-7811 be programmed in LabVIEW FPGA?
    Answer 3: Yes

    Question 4: Is the PXI-7811 still available for purchase?
    Answer 4: Yes, through Apex Waves

    Question 5: What applications is the PXI-7811 designed for?
    Answer 5: Waveform generation, HIL test, and more