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157665A-01L

The PXIe-6570, with part numbers 157665A-01L, 785283-01, is a digital instrument for semiconductor and production tests, supporting 100 MVector/s.

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    Description

    The PXIe-6570 is a state-of-the-art digital instrument designed specifically for use within the PXI Digital Instruments category. This device carries part numbers 157665A-01L and 785283-01, ensuring a broad spectrum of compatibility and application. The model is engineered to support a high vector rate of 100 MVector/s, making it an ideal choice for demanding applications such as semiconductor testing and production tests.

    It comes equipped with a comprehensive suite of tools designed to enhance its functionality and usability. These tools include the Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, and Framework States Viewer. Each tool is tailored to provide in-depth analysis and control, ensuring users can maximize the device’s capabilities.

    The PXIe-6570 supports various drive formats including Non-return, Return to Low, Return to High, and Surround by Complement. This flexibility allows it to adapt to a wide range of testing scenarios and requirements. Moreover, its compatibility spans across RF and Mixed Signal Integrated Circuits (ICs), RF Front Ends, Power Management ICs, Transceivers, and the broader Internet infrastructure, making it a versatile tool for a multitude of electronic testing environments.

    This instrument is part of the NI PXI Platform and is fully compatible with the NI Semiconductor Test System (STS). This integration ensures that users can leverage the full power of National Instruments’ ecosystem, benefiting from seamless integration and streamlined workflows.

    Feature Description
    Part Number 157665A-01L, 785283-01
    Category PXI Digital Instruments
    Model PXIe-6570
    Vector Rate 100 MVector/s
    Application Semiconductor Testing, Production Tests
    Tools Included Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, Framework States Viewer
    Drive Formats Supported Non-return, Return to Low, Return to High, Surround by Complement
    Compatibility RF and Mixed Signal Integrated Circuits (ICs), RF Front Ends, Power Management ICs, Transceivers, Internet
    Platform NI PXI Platform, NI Semiconductor Test System (STS)

    Question 1: What is the vector rate of PXIe-6570?
    Answer 1: 100 MVector/s

    Question 2: Can PXIe-6570 be used for semiconductor testing?
    Answer 2: Yes, it’s ideal for semiconductor and production tests.

    Question 3: What drive formats does the PXIe-6570 support?
    Answer 3: Non-return, Return to Low, High, Surround by Complement.

    Question 4: Is the PXIe-6570 part of the NI PXI Platform?
    Answer 4: Yes, it’s fully compatible with the NI PXI Platform.

    Question 5: What tools come with the PXIe-6570?
    Answer 5: Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer.