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157665E-01L

The PXIe-6570 is a CCA, pattern-based digital base board for semiconductor tests, featuring a 100 MVector/s rate and advanced debugging tools.

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    Description

    The Part Number 785283-01 refers to a high-grade component categorized under PXI Digital Instruments. Specifically, it is the PXIe-6570 model, dedicated to serving as a CCA, PATTERN BASED DIGITAL BASE BOARD. This piece of equipment is renowned for its impressive vector rate of 100 MVector/s, making it a cornerstone in the field of semiconductor portrayal and production tests.

    One of the standout aspects of this device is its application in testing RF and mixed signal integrated circuits (ICs). The PXIe-6570 model is equipped with a suite of key features designed to streamline the testing process. These include a Digital Pattern Editor and a range of debugging tools such as Shmoo, digital scope, as well as viewers for History RAM, pin states, and framework states. Such features are indispensable for professionals aiming to conduct thorough and efficient analyses.

    In terms of drive formats, the device supports a variety of options including non-return, return to low, return to high, and surround by complement. This flexibility ensures that users can adapt the instrument to their specific testing requirements without compromise. Moreover, the PXIe-6570 boasts platform compatibility with the NI PXI platform and the NI Semiconductor Test System (STS). This compatibility further extends its utility and integration capabilities into existing systems, making it a versatile choice for semiconductor testing applications.

    Feature Description
    Part Number 785283-01
    Category PXI Digital Instruments
    Model PXIe-6570
    Description CCA, PATTERN BASED DIGITAL BASE BOARD
    Vector Rate 100 MVector/s
    Application Semiconductor portrayal and production tests
    Key Features Digital Pattern Editor, Debugging tools (Shmoo, digital scope, viewers for History RAM, pin states, and framework states)
    Drive Formats Supported Non-return, return to low, return to high, and surround by complement
    Platform Compatibility NI PXI platform, NI Semiconductor Test System (STS)
    Intended Use Testing RF and mixed signal integrated circuits (ICs)

    Question 1: What is the vector rate of the PXIe-6570?
    Answer 1: 100 MVector/s

    Question 2: Which platforms is the PXIe-6570 compatible with?
    Answer 2: NI PXI platform and NI STS

    Question 3: What does the PXIe-6570 primarily test?
    Answer 3: RF and mixed signal ICs

    Question 4: What are the drive formats supported by the PXIe-6570?
    Answer 4: Non-return, RT low, RT high, surround by complement

    Question 5: What unique feature does the PXIe-6570 offer for debugging?
    Answer 5: Shmoo, digital scope, viewers for History RAM