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157665F-03L

The PXIe-6570, part number 785283-01, is a PXI Digital Instrument for RF and mixed-signal IC tests, featuring a 100 MVector/s rate and advanced analysis tools.

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    Description

    The 785283-01 is a PXI Digital Instrument that falls under the category of PXIe-6570 models. This particular model is designed as a Pattern Based Digital Base Board, tailored for sophisticated digital testing scenarios. It stands out for its ability to deliver a vector rate of up to 100 MVector/s, making it a highly efficient tool in a variety of testing environments.

    One of the key features of the PXIe-6570 includes the Digital Pattern Editor, which offers a user-friendly interface for creating and managing test patterns. Additional features such as Shmoo, Digital Scope, and viewers for History RAM, Pin States, and Framework States significantly enhance its functionality, providing users with comprehensive tools for detailed analysis and debugging.

    This model is particularly suited for the characterization and production tests of RF and Mixed Signal Integrated Circuits (ICs). Its compatibility with the PXI Platform and the NI Semiconductor Test System (STS) ensures that it can be seamlessly integrated into existing testing frameworks, offering a versatile solution for a broad range of applications.

    Additionally, the PXIe-6570 supports various drive formats including Non-return, Return to Low, Return to High, and Surround by Complement. This flexibility allows users to adapt the instrument to specific testing requirements, ensuring optimal performance and accuracy in every application.

    Specification Description
    Part Number 785283-01
    Category PXI Digital Instruments
    Model PXIe-6570
    Description Pattern Based Digital Base Board
    Vector Rate 100 MVector/s
    Key Features Digital Pattern Editor, Shmoo, Digital Scope, Viewers for History RAM, Pin States, Framework States
    Application Characterization and Production Tests of RF and Mixed Signal Integrated Circuits (ICs)
    Compatibility PXI Platform, NI Semiconductor Test System (STS)
    Drive Formats Supported Non-return, Return to Low, Return to High, Surround by Complement

    Question 1: What is the vector rate of PXIe-6570?
    Answer 1: 100 MVector/s

    Question 2: What tool does PXIe-6570 feature for test pattern management?
    Answer 2: Digital Pattern Editor

    Question 3: For what IC tests is PXIe-6570 particularly suited?
    Answer 3: RF and Mixed Signal ICs

    Question 4: Can PXIe-6570 integrate with NI Semiconductor Test System?
    Answer 4: Yes

    Question 5: What unique drive formats does PXIe-6570 support?
    Answer 5: Non-return, Return to Low/High, Surround by Complement