Description
The PXIe-6570 is a key component in the PXI Digital Instruments category, designed specifically for semiconductor characterization and production test environments. It carries a part number of 157668A-01L (Primary) and 785283-01, ensuring that you are accessing the right equipment for your testing needs.
This model boasts an impressive vector rate of 100 MVector/s, making it capable of handling the rigorous demands of semiconductor testing with efficiency. Whether you’re working on RF and Mixed Signal Integrated Circuits (ICs) testing, the PXIe-6570 is engineered to provide the precision and speed required for these complex tasks.
When it comes to software tools, the PXIe-6570 utilizes the Digital Pattern Editor, enhancing the user’s ability to create and manage test patterns with ease. Moreover, it is equipped with a suite of debugging tools including Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, and Framework States Viewer. These tools are invaluable for diagnosing and resolving any issues that may arise during the testing process, ensuring a smooth and efficient workflow.
Support for multiple drive formats is another highlight of the PXIe-6570, including Non-return, Return to Low, Return to High, and Surround by Complement. This versatility ensures that the device can accommodate a wide range of testing scenarios and requirements.
Compatibility is also a key feature, with the PXIe-6570 being compatible with both the NI PXI Platform and the NI Semiconductor Test System (STS). This ensures seamless integration into your existing test environment, minimizing setup time and compatibility issues.
Finally, the PXIe-6570 is recommended for testing a variety of devices, including RF front ends, Power Management ICs, Transceivers, and Internet of Things (IoT) Devices. Its focus on RF and Mixed Signal ICs testing makes it an indispensable tool for engineers and technicians working in these areas.
| Specification | Detail |
|---|---|
| Part Number | 157668A-01L (Primary), 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Vector Rate | 100 MVector/s |
| Application | Semiconductor Characterization and Production Test |
| Software Tool | Digital Pattern Editor |
| Debugging Tools | Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, Framework States Viewer |
| Drive Formats Supported | Non-return, Return to Low, Return to High, Surround by Complement |
| Platform Compatibility | NI PXI Platform, NI Semiconductor Test System (STS) |
| Applications Focus | RF and Mixed Signal Integrated Circuits (ICs) Testing |
| Recommended for | RF front ends, Power Management ICs, Transceivers, Internet of Things (IoT) Devices |
Question 1: What is the vector rate of the PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What software tool does the PXIe-6570 use?
Answer 2: Digital Pattern Editor
Question 3: Can the PXIe-6570 support Return to Low drive format?
Answer 3: Yes
Question 4: Is the PXIe-6570 compatible with the NI PXI Platform?
Answer 4: Yes
Question 5: What are the recommended devices for testing with the PXIe-6570?
Answer 5: RF front ends, Power Management ICs, Transceivers, IoT Devices
