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157668B-01L

The PXIe-6570, part number 785283-01, is a Pattern Based Digital Power Connector Board for semiconductor tests, featuring a 100 MVector/s rate and various digital tools.

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    Description

    The Part Number 785283-01 refers to a Pattern Based Digital Power Connector Board classified under the category of PXI Digital Instruments. This particular model, the PXIe-6570, is designed to cater to the needs of semiconductor portrayal and production tests.

    One of the standout specifications of this model is its Vector Rate, which is capable of reaching up to 100 MVector/s, making it an efficient choice for high-speed testing requirements. The application of this instrument is mainly focused on Semiconductor portrayal and production tests, highlighting its importance in the semiconductor manufacturing industry.

    Among its Key Features are a Digital Pattern Editor, Shmoo, digital scope, History RAM viewers, pin states viewers, and framework states viewers. These features provide users with comprehensive tools for detailed analysis and testing of semiconductor devices.

    The Drive Formats Supported by this model include Non-return, return to low, return to high, and surround by complement, offering versatility in testing different signal types. Compatibility is also a strong suit of the PXIe-6570, as it is designed to work seamlessly with PXI and the NI Semiconductor Test System (STS), ensuring a wide range of use cases and integration into existing test setups.

    This model is Recommended for testing RF and mixed signal ICs, RF front ends, power management ICs, and transceivers, showcasing its utility in a variety of semiconductor testing scenarios. The combination of its high vector rate, versatile features, and compatibility makes the PXIe-6570 an essential instrument for professionals in the semiconductor industry.

    Specification Detail
    Part Number 785283-01
    Category PXI Digital Instruments
    Model PXIe-6570
    Description Pattern Based Digital Power Connector Board
    Vector Rate 100 MVector/s
    Application Semiconductor portrayal and production tests
    Key Features Digital Pattern Editor, Shmoo, digital scope, History RAM viewers, pin states viewers, framework states viewers
    Drive Formats Supported Non-return, return to low, return to high, surround by complement
    Platform Compatibility PXI, NI Semiconductor Test System (STS)
    Recommended for Testing RF and mixed signal ICs, RF front ends, power management ICs, transceivers

    Question 1: What is the part number for the PXIe-6570 model?
    Answer 1: 785283-01

    Question 2: What vector rate does the PXIe-6570 support?
    Answer 2: 100 MVector/s

    Question 3: Is the PXIe-6570 suitable for semiconductor tests?
    Answer 3: Yes, for portrayal and production.

    Question 4: What drive formats does the PXIe-6570 support?
    Answer 4: NR, RTL, RTH, and surround by complement.

    Question 5: Can the PXIe-6570 integrate with NI STS?
    Answer 5: Yes, it’s designed for compatibility.