Description
The product with the Part Number 158234F-02L and an Alternative Part Number of 785283-01 falls under the Category of PXI Digital Instruments. This particular model, designated as PXIe-6570, is specifically designed as a PXIe-6570, Digital Pattern Instrument, 32 CH. It is known for its impressive Vector Rate of 100 MVector/s, making it a powerful tool for various applications.
One of the primary Applications for this device includes semiconductor characterization and production tests, highlighting its critical role in ensuring the quality and performance of semiconductor components. Additionally, its Application Scope extends to RF and mixed signal integrated circuits (ICs) testing, showcasing its versatility and utility in a broad range of testing scenarios.
The Features of the PXIe-6570 are particularly noteworthy, including a Digital Pattern Editor, Shmoo, digital scope, and viewers for History RAM, pin states, and framework states. These features provide users with comprehensive tools and functionalities necessary for advanced testing and analysis.
When it comes to Drive Formats Supported, the PXIe-6570 is compatible with a variety of formats, including Non-return, return to low, return to high, and surround by complement. This flexibility ensures that users can adapt the instrument to various testing requirements and scenarios.
Lastly, the PXIe-6570 boasts Compatibility with the NI PXI platform and the NI Semiconductor Test System (STS), ensuring seamless integration and interoperability with existing systems and components. This compatibility further enhances its utility and effectiveness in a wide range of testing environments.
| Specification | Description |
|---|---|
| Part Number | 158234F-02L |
| Alternative Part Number | 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Description | PXIe-6570, Digital Pattern Instrument, 32 CH |
| Vector Rate | 100 MVector/s |
| Application | Semiconductor characterization and production tests |
| Features | Digital Pattern Editor, Shmoo, digital scope, viewers for History RAM, pin states, and framework states |
| Drive Formats Supported | Non-return, return to low, return to high, surround by complement |
| Compatibility | NI PXI platform and NI Semiconductor Test System (STS) |
| Application Scope | RF and mixed signal integrated circuits (ICs) testing |
Question 1: What is the vector rate of the PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What are the drive formats supported by PXIe-6570?
Answer 2: Non-return, return to low, high, surround by complement
Question 3: Is PXIe-6570 compatible with NI PXI platforms?
Answer 3: Yes, it’s compatible with NI PXI platforms.
Question 4: What are the applications of the PXIe-6570?
Answer 4: Semiconductor characterization and RF, mixed signal ICs testing
Question 5: What features does the PXIe-6570 offer?
Answer 5: Digital Pattern Editor, Shmoo, digital scope, History RAM viewers
