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135289A-01

The 135289A-01 is a Semiconductor Test System, model STS T4M2 DX, designed specifically for Melexis Wafer Probe applications.

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    Description

    The part with the part number 135289A-01 falls under the category of Semiconductor Test System. It is identified as model STS T4M2. The short description of this product is “STS System, NI STS T4M2 DX for Melexis Wafer Probe“. This indicates that the product is specifically designed for use in wafer probing applications, catering to the needs of users requiring high precision and efficiency in semiconductor testing environments.

    Part Number 135289A-01
    Category Semiconductor Test System
    Model STS T4M2
    Short Description STS System, NI STS T4M2 DX for Melexis Wafer Probe

    Question 1: What is the part number for the STS T4M2 model?
    Answer 1: The part number is 135289A-01.

    Question 2: What category does the 135289A-01 belong to?
    Answer 2: It belongs to the Semiconductor Test System category.

    Question 3: What is the short description for 135289A-01?
    Answer 3: STS System, NI STS T4M2 DX for Melexis Wafer Probe.

    Question 4: What applications is the 135289A-01 designed for?
    Answer 4: Designed for Melexis Wafer Probe applications.

    Question 5: Is the 135289A-01 specific to any testing environments?
    Answer 5: Yes, for high precision semiconductor testing environments.