Description
The Part Number 135289B-01 refers to a high-quality Semiconductor Test System known as the STS T4M2. This particular model is designed to offer advanced testing capabilities for semiconductor wafers, ensuring accurate and reliable results. The STS System, NI STS T4M2 DX for Melexis Wafer Probe, is specifically tailored to meet the stringent requirements of Melexis wafer probe applications, providing exceptional performance and efficiency in semiconductor testing processes.
| Part Number | 135289B-01 |
|---|---|
| Category | Semiconductor Test System |
| Model | STS T4M2 |
| Short Description | STS System, NI STS T4M2 DX for Melexis Wafer Probe |
Question 1: What is part number 135289B-01?
Answer 1: It’s a Semiconductor Test System, STS T4M2.
Question 2: What is the STS T4M2 designed for?
Answer 2: Designed for Melexis Wafer Probe applications.
Question 3: Does the STS T4M2 offer reliable results?
Answer 3: Yes, it ensures accurate and reliable testing results.
Question 4: Is the 135289B-01 tailored for specific applications?
Answer 4: Yes, for Melexis wafer probe applications.
Question 5: What does the STS T4M2 model provide?
Answer 5: Advanced testing capabilities for semiconductor wafers.
