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135306B-01

The 135306B-01, a Semiconductor Test System STS T4M2, is an NI STS T4 M2 DX for Melexis Wafer X32.

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    Description

    The product with the part number 135306B-01 falls under the category of Semiconductor Test System. It is specifically the model STS T4M2. This particular model is designed for high efficiency and performance in testing semiconductors. The short description of this product is “STS System, NI STS T4 M2 DX for Melexis Wafer X32”. This description indicates that the system is tailored for use with Melexis Wafer X32, showcasing its compatibility and specialized design for specific semiconductor testing requirements.

    Part Number 135306B-01
    Category Semiconductor Test System
    Model STS T4M2
    Short Description STS System, NI STS T4 M2 DX for Melexis Wafer X32

    Question 1: What is the part number for the STS T4M2 model?
    Answer 1: 135306B-01

    Question 2: What category does the 135306B-01 belong to?
    Answer 2: Semiconductor Test System

    Question 3: What is the model number of the Semiconductor Test System?
    Answer 3: STS T4M2

    Question 4: What is the short description of 135306B-01?
    Answer 4: NI STS T4 M2 DX for Melexis Wafer X32

    Question 5: Who is the STS T4M2 designed for?
    Answer 5: Designed for Melexis Wafer X32