img

130215A-01

The 130215A-01 is a semiconductor test system, STS T1M2 model, designed as an STS Chassis Kit for LEADYO_WLAN Octal Sites.

In Stock | Ships Today

img

    Description

    Part Number: The specific part number for this product is 130215A-01. This identifier is essential for ensuring you receive the correct item when ordering or inquiring about this particular semiconductor test system.

    Category: This item falls under the Semiconductor Test System category. It is designed for high precision and efficiency in testing semiconductor devices, ensuring that they meet the required specifications and standards for performance.

    Model: The model of this semiconductor test system is STS T1M2. This model is known for its robustness and reliability in conducting tests on semiconductor components, making it a valuable tool in the semiconductor manufacturing process.

    Description: The product is described as an STS Chassis Kit, Chassis 1, NI STS T1M2 DX for LEADYO_WLAN Octal Sites. This detailed description indicates that the kit includes a chassis (Chassis 1) and is specifically designed for use with LEADYO_WLAN Octal Sites, highlighting its suitability for wireless local area network (WLAN) applications in semiconductor testing environments.

    Specification Details
    Part Number 130215A-01
    Category Semiconductor Test System
    Model STS T1M2
    Description STS Chassis Kit, Chassis 1, NI STS T1M2 DX for LEADYO_WLAN Octal Sites

    Question 1: What is the part number of the STS T1M2 model?
    Answer 1: The part number is 130215A-01.

    Question 2: What category does the 130215A-01 fall under?
    Answer 2: It falls under Semiconductor Test System.

    Question 3: What is the model of the semiconductor test system?
    Answer 3: The model is STS T1M2.

    Question 4: What is included in the 130215A-01 kit?
    Answer 4: Includes STS Chassis Kit for LEADYO_WLAN Octal Sites.

    Question 5: What is the application area of the 130215A-01?
    Answer 5: Designed for WLAN applications in semiconductor testing.