Description
The Part Number 132006A-01 refers to a state-of-the-art Semiconductor Test System, specifically designed to meet the rigors of high-volume production environments. This system falls under the category of Semiconductor Test Systems, indicating its critical role in ensuring the performance and reliability of semiconductor devices.
The model in question, STS T4M2, represents a specific configuration tailored to deliver unparalleled testing capabilities. This model is part of a broader suite of testing solutions that combine advanced technology with user-friendly interfaces to streamline the testing process.
Providing a more detailed look, the system is described as an STS System, NI STS T4M2 DX for Carsem Lin2 T4. This description highlights its compatibility and specialized design for Carsem Lin2 T4 applications, showcasing its tailored approach towards semiconductor testing. The incorporation of NI (National Instruments) technology within the STS T4M2 DX variant underscores the system’s advanced capabilities in delivering precise and reliable test results.
In summary, the Semiconductor Test System with Part Number 132006A-01 and Model STS T4M2, stands as a critical tool in the semiconductor manufacturing industry. Its specialized design for Carsem Lin2 T4 applications, combined with the advanced technology of NI, makes it an indispensable asset for ensuring the quality and reliability of semiconductor products.
| Part Number | 132006A-01 |
|---|---|
| Category | Semiconductor Test System |
| Model | STS T4M2 |
| Short Description | STS System, NI STS T4M2 DX for Carsem Lin2 T4 |
Question 1: What is the part number for the Semiconductor Test System?
Answer 1: The part number is 132006A-01.
Question 2: What model is designed for Carsem Lin2 T4 applications?
Answer 2: Model STS T4M2 is designed for Carsem Lin2 T4.
Question 3: Is the STS T4M2 equipped with NI technology?
Answer 3: Yes, it includes National Instruments technology.
Question 4: What category does the 132006A-01 belong to?
Answer 4: It belongs to Semiconductor Test Systems.
Question 5: What is the primary use of the 132006A-01 system?
Answer 5: It’s used for testing semiconductor devices.
