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132016A-01

The 132016A-01 is a Semiconductor Test System chassis kit for STS, specifically Chassis 4, NI STS T4M2 DX for NI R and D TSMRF Bench.

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    Description

    The Part Number for this product is 132016A-01, indicating a specific item within our inventory. This part falls under the Category of Semiconductor Test System, which suggests its application in testing and validating semiconductor devices to ensure their performance and reliability.

    The Model associated with this part is Chassis Kits for STS. This model designation implies that the product is part of a series of chassis kits designed specifically for Semiconductor Test Systems (STS), offering a structured and efficient means of housing and connecting various test system components.

    The Short Description provided is STS Chassis Kit, Chassis 4, NI STS T4M2 DX for NI R and D TSMRF Bench. This description indicates that the kit includes the fourth chassis configuration in the series, tailored for use with the NI STS T4M2 DX. It is specifically designed to integrate with the National Instruments Research and Development Test System for Modulated RF (TSMRF) benches. This delineation highlights the kit’s role in facilitating advanced testing setups for R&D purposes in the semiconductor field.

    Specification Detail
    Part Number 132016A-01
    Category Semiconductor Test System
    Model Chassis Kits for STS
    Short Description STS Chassis Kit, Chassis 4, NI STS T4M2 DX for NI R and D TSMRF Bench

    Question 1: What is the part number for the STS chassis kit?
    Answer 1: The part number is 132016A-01.

    Question 2: Under which category does the 132016A-01 fall?
    Answer 2: It falls under the Semiconductor Test System category.

    Question 3: What is the model for the part 132016A-01?
    Answer 3: The model is Chassis Kits for STS.

    Question 4: What does the 132016A-01 kit specifically include?
    Answer 4: Includes STS Chassis 4, NI STS T4M2 DX for TSMRF Bench.

    Question 5: What is the application of 132016A-01?
    Answer 5: For R&D testing of semiconductor devices.