Description
The Part Number 132659A-01 refers to a high-quality Semiconductor Test System that is categorized under the model STS T4M2. This particular system is designed to meet the rigorous demands of semiconductor testing, offering a comprehensive solution for engineers and technicians in the field.
The STS T4M2 model is equipped with advanced STS Options, including the NI STS T4M2 DX DS MMW which features both a Baseband (BB) and Local Oscillator (LO) function. These options enhance the system’s capability to perform a wide range of tests on semiconductor devices, ensuring high precision and reliability in measurements.
This test system is tailored for applications that require detailed and accurate semiconductor analysis. Its robust design and cutting-edge features make it an indispensable tool for semiconductor manufacturers and research laboratories aiming for excellence in device testing and validation.
Part Number | 132659A-01 |
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Category | Semiconductor Test System |
Model | STS T4M2 |
Short Description | STS Options, NI STS T4M2 DX DS MMW with BB and LO |