Description
The 132765C-01 is a state-of-the-art Semiconductor Test System designed for high-performance testing applications. As a model STS T4M2, it represents the cutting edge in testing technology, catering specifically to the demands of semiconductor testing. The system is characterized by its dynamic capabilities, making it an ideal solution for a wide range of testing scenarios.
The short description of this product, STS Dynamic, NI STS T4M2 DX 5G MMW FT S, highlights its specialized features for dynamic testing, support for 5G Millimeter Wave (MMW) frequencies, and fast testing (FT) capabilities. This makes the system particularly suited for testing the latest semiconductor devices that require support for high frequencies and fast, efficient testing methodologies.
| Part Number | 132765C-01 |
|---|---|
| Category | Semiconductor Test System |
| Model | STS T4M2 |
| Short Description | STS Dynamic, NI STS T4M2 DX 5G MMW FT S |
Question 1: What is the part number of the STS T4M2?
Answer 1: 132765C-01.
Question 2: What does STS T4M2 specialize in?
Answer 2: Dynamic testing & 5G MMW frequencies.
Question 3: Is the STS T4M2 suited for fast testing?
Answer 3: Yes, it has fast testing capabilities.
Question 4: What type of system is the 132765C-01?
Answer 4: A Semiconductor Test System.
Question 5: What makes the STS T4M2 ideal for semiconductor testing?
Answer 5: High-performance & dynamic capabilities.
