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133670A-01

The 133670A-01 is a Semiconductor Test System, model STS T4M2, designed for QC RFFE+Harmet testing.

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    Description

    The product with the Part Number 133670A-01 falls under the Category of Semiconductor Test System. It is identified by the Model STS T4M2. This particular model provides a robust solution for testing semiconductor devices, ensuring high-quality performance and reliability. The Short Description of the product is “STS System, NI STS T4M2 DX for QC RFFE+Harmet”, which indicates that this system is tailored specifically for quality control of RFFE (Radio Frequency Front-End) and Harmet applications. This specialized focus ensures that the system is well-equipped to handle the specific needs and requirements of testing in these advanced technological domains.

    Specification Details
    Part Number 133670A-01
    Category Semiconductor Test System
    Model STS T4M2
    Short Description STS System, NI STS T4M2 DX for QC RFFE+Harmet

    Question 1: What is the part number of the STS T4M2?
    Answer 1: 133670A-01

    Question 2: What category does the STS T4M2 fall under?
    Answer 2: Semiconductor Test System

    Question 3: What is the STS T4M2 designed for?
    Answer 3: QC RFFE+Harmet testing

    Question 4: What is the model of the Semiconductor Test System?
    Answer 4: STS T4M2

    Question 5: What is the specialized focus of STS T4M2?
    Answer 5: RFFE and Harmet applications