Description
The Semiconductor Test System described by the part number 134768A-01 falls into a specialized category of equipment designed for testing semiconductor devices. The model for this particular system is STS T4M2, which indicates a specific configuration tailored for comprehensive testing scenarios. The short description of this system, “STS System, NI STS T4M2 DX for QC RFFE + Harm + ET + CW”, provides insight into its capabilities and intended use cases. This system is designed to handle Quality Control (QC) for RF Front End (RFFE) modules, alongside tests for Harmonics (Harm), Envelope Tracking (ET), and Continuous Wave (CW) signals, showcasing its versatility and advanced testing capabilities in semiconductor manufacturing and development environments.
| Specification | Details |
|---|---|
| Part Number | 134768A-01 |
| Category | Semiconductor Test System |
| Model | STS T4M2 |
| Short Description | STS System, NI STS T4M2 DX for QC RFFE + Harm + ET + CW |
Question 1: What is the part number of the STS T4M2?
Answer 1: 134768A-01
Question 2: What tests can the STS T4M2 perform?
Answer 2: QC RFFE, Harm, ET, and CW
Question 3: What does STS stand for in the context of the 134768A-01?
Answer 3: Semiconductor Test System
Question 4: What is the primary use of the STS T4M2?
Answer 4: Testing semiconductor devices
Question 5: What does RFFE stand for in QC RFFE testing?
Answer 5: RF Front End
