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135292B-01

The 135292B-01 is a Semiconductor Test System, STS T4M2 model, for Melexis Wafer Probe.

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    Description

    The 135292B-01 is a state-of-the-art Semiconductor Test System designed to meet the high demands of the semiconductor testing industry. This particular model, the STS T4M2, is specifically tailored for applications involving Melexis wafer probing, ensuring high precision and reliability in semiconductor testing processes.

    The system comes as a comprehensive STS Chassis Kit, including Chassis 3, which forms the core of the NI STS T4 M2 DX configuration. This kit is meticulously engineered to provide robust support and functionality for Melexis Wafer Probe operations, making it an indispensable tool for semiconductor testing and validation.

    Specification Detail
    Part Number 135292B-01
    Category Semiconductor Test System
    Model STS T4M2
    Short Description STS Chassis Kit, Chassis 3, NI STS T4 M2 DX for Melexis Wafer Probe

    Question 1: What is the part number for the Semiconductor Test System?
    Answer 1: The part number is 135292B-01.

    Question 2: What model is the 135292B-01 designed for?
    Answer 2: It’s designed for the STS T4M2 model.

    Question 3: Is the 135292B-01 suitable for Melexis Wafer Probe?
    Answer 3: Yes, it’s specifically tailored for Melexis Wafer Probe.

    Question 4: What does the 135292B-01 kit include?
    Answer 4: Includes Chassis 3 for the NI STS T4 M2 DX configuration.

    Question 5: What is the main application of the 135292B-01?
    Answer 5: It’s used in semiconductor testing and validation.