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142829B-01L

The PXIe-6570 (part number 785283-01) is a PXI Digital Instrument for RF and mixed signal IC tests, featuring a 100 MVector/s rate and specialized tools.

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    Description

    The Part Number for this device is 785283-01, indicating its unique identification within its manufacturing series. This device is modeled as the PXIe-6570, which falls under the category of PXI Digital Instruments. It is specifically designed to facilitate high-performance tasks with a Max Vector Rate of 100 MVector/s, making it highly efficient for its intended applications.

    The primary Application of the PXIe-6570 is geared towards the characterization and production tests of RF and mixed-signal ICs. This broad application scope highlights its versatility and importance in the testing and development phases of electronic components. Moreover, it supports various platforms including NI PXI and the NI Semiconductor Test System (STS), showcasing its adaptability within different testing environments.

    Among its Key Features, the device boasts a comprehensive suite of tools including a Digital Pattern Editor, Shmoo, digital scope, History RAM viewer, pin states viewer, and a framework states viewer. These features are instrumental in providing detailed and nuanced insights into the device’s performance and operational states, enhancing the user’s ability to conduct thorough and accurate tests.

    Furthermore, the PXIe-6570 supports various Drive Formats such as Non-return, return to low, return to high, and surround by complement. This flexibility in drive format compatibility ensures that it can meet the diverse needs of different testing scenarios and requirements, making it a highly versatile tool for professionals in the field of electronic component testing and characterization.

    Specification Detail
    Part Number 785283-01
    Model PXIe-6570
    Category PXI Digital Instruments
    Max Vector Rate 100 MVector/s
    Application Characterization and production tests of RF and mixed signal ICs
    Supported Platforms NI PXI, NI Semiconductor Test System (STS)
    Key Features Digital Pattern Editor, Shmoo, digital scope, History RAM viewer, pin states viewer, framework states viewer
    Drive Formats Supported Non-return, return to low, return to high, surround by complement

    Question 1: What is the part number of the PXIe-6570?
    Answer 1: 785283-01

    Question 2: What is the max vector rate of the PXIe-6570?
    Answer 2: 100 MVector/s

    Question 3: What is the primary application of PXIe-6570?
    Answer 3: Tests of RF and mixed-signal ICs

    Question 4: Which platforms does the PXIe-6570 support?
    Answer 4: NI PXI, NI STS

    Question 5: What are the drive formats supported by PXIe-6570?
    Answer 5: Non-return, return to low, high, surround by complement