Description
The 157665B-01L, also known by its alternative part number 785283-01, is an essential component within the category of PXI Digital Instruments. Specifically, it is the model PXIe-6570 known for its high performance in digital testing. This model boasts a remarkable vector rate of 100 MVector/s, positioning it as a powerful tool for executing complex digital patterns with efficiency and precision.
At its core, the PXIe-6570 serves as a Digital Pattern Instrument, designed to meet the rigorous demands of both characterization and production tests of RF and mixed-signal integrated circuits (ICs). Its main function is complemented by an array of integrated tools such as Shmoo, digital scope, and viewers for History RAM, pin states, and framework states. These tools enhance the instrument’s capability to provide detailed insights and diagnostics during the test process.
Supporting a variety of drive formats, including Non-return, return to low, return to high, and surround by complement, the PXIe-6570 offers versatility in testing methodologies. This flexibility ensures it can adapt to a wide range of testing scenarios and signal requirements, making it an invaluable asset for applications that focus on the characterization and production tests of RF and mixed signal ICs.
Compatibility is another strength of the PXIe-6570, as it seamlessly integrates with the NI PXI platform and NI Semiconductor Test System (STS). This integration ensures that users can leverage the robust ecosystem of NI’s hardware and software solutions, enhancing the overall testing and development process.
To further assist in the design and execution of tests, the PXIe-6570 includes the Digital Pattern Editor. This software tool is specifically designed for creating detailed pin maps, specifications, levels, timing, and samples, thereby simplifying the process of test development and execution. The inclusion of this editor underscores the PXIe-6570’s commitment to providing a comprehensive solution for digital pattern testing.
| Specification | Details |
|---|---|
| Part Number | 157665B-01L |
| Alternative Part Number | 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Vector Rate | 100 MVector/s |
| Main Function | Digital Pattern Instrument |
| Integrated Tools | Shmoo, digital scope, viewers for History RAM, pin states, and framework states |
| Supported Drive Formats | Non-return, return to low, return to high, surround by complement |
| Application | Characterization and production tests of RF and mixed signal ICs |
| Compatibility | NI PXI platform and NI Semiconductor Test System (STS) |
| Includes | Digital Pattern Editor for designing pin maps, specifications, levels, timing, and samples |
Question 1: What is the vector rate of PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What are the drive formats supported by PXIe-6570?
Answer 2: Non-return, return to low, high, surround by complement
Question 3: What tools do PXIe-6570 integrate for test insights?
Answer 3: Shmoo, digital scope, viewers for History RAM
Question 4: What is the part number for PXIe-6570?
Answer 4: 157665B-01L and 785283-01
Question 5: With what systems is PXIe-6570 compatible?
Answer 5: NI PXI platform and NI STS
