Description
The 157665B-03L, also known by its alternative part number 785283-01, falls under the category of PXI Digital Instruments. This particular model, the PXIe-6570, is designed as a CCA (Circuit Card Assembly), specifically a pattern-based digital base board incorporating an ISL55163. Its main functionality is as a 100 MVector/s Digital Pattern Instrument, tailored for high-speed, precise digital testing.
One of the key features of the PXIe-6570 is its comprehensive suite of digital pattern editing and debugging tools. These tools include Shmoo for stress testing, a digital oscilloscope for signal analysis, History RAM for capturing and analyzing sequences of events, Pin States for real-time monitoring of pin logic levels, and Framework States for system-level debugging. These features make it an invaluable tool for developers and engineers working in the field of digital circuit design and testing.
The PXIe-6570 is primarily used in the characterization and production tests of RF and mixed signal Integrated Circuits (ICs). Its compatibility with the NI PXI platform and the NI Semiconductor Test System (STS) ensures that it can be seamlessly integrated into existing test setups, providing users with a versatile and powerful testing solution.
In terms of drive formats, the PXIe-6570 supports Non-return, Return to Low, Return to High, and Surround by Complement. This versatility in drive format support further enhances its applicability in a wide range of digital testing scenarios, ensuring that it meets the needs of a diverse range of applications in the semiconductor industry.
| Specification | Detail |
|---|---|
| Part Number | 157665B-03L |
| Alternative Part Number | 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Description | CCA,PATTERN BASED DIGITAL BASE BOARD, ISL55163 |
| Functionality | 100 MVector/s Digital Pattern Instrument |
| Features | Digital Pattern Editor, Debugging Tools (Shmoo, Digital Scope, History RAM, Pin States, Framework States) |
| Application | Characterization and production tests of RF and mixed signal ICs |
| Compatibility | NI PXI platform, NI Semiconductor Test System (STS) |
| Drive Formats Supported | Non-return, Return to Low, Return to High, Surround by Complement |
Question 1: What is the PXIe-6570 used for?
Answer 1: RF and mixed signal IC tests at 100 MVector/s.
Question 2: Does the PXIe-6570 have debugging tools?
Answer 2: Yes, it has advanced digital pattern editing and debugging tools.
Question 3: What drive formats does PXIe-6570 support?
Answer 3: Non-return, Return to Low, High, and Surround by Complement.
Question 4: Can PXIe-6570 integrate with NI platforms?
Answer 4: Yes, compatible with NI PXI and Semiconductor Test Systems.
Question 5: What is the alternate part number for 157665B-03L?
Answer 5: 785283-01.
