Description
The 785283-01 is a part of the PXIe-6570 model, which falls under the category of PXI Digital Instruments. This particular model is described as a CCA, PATTERN BASED DIGITAL BASE BOARD, designed specifically for the characterization and production tests of semiconductors. One of the standout features of this model is its vector rate, which is capable of reaching up to 100 MVector/s, providing efficient and accurate testing capabilities.
When it comes to applications, this device is tailored for characterization and production tests of semiconductors, making it an essential tool for professionals in the semiconductor industry. The tools included with this model are comprehensive and designed to enhance the user’s testing capabilities. These tools include the Digital Pattern Editor, Shmoo, digital scope, History RAM viewer, pin state viewer, and framework state viewer. Such an array of tools ensures that users have everything they need for detailed and thorough testing procedures.
The PXIe-6570 supports a variety of drive formats, including non-return, return to low, return to high, and surround by complement. This flexibility in drive formats allows users to adapt the testing process to meet the specific requirements of the device under test. Moreover, this model boasts compatibility with RF and mixed-signal integrated circuits testing on the NI PXI platform and Semiconductor Test System (STS), ensuring that it can be integrated into various testing environments with ease.
In summary, the PXIe-6570 is a versatile and powerful instrument designed for the semiconductor testing industry, offering a high vector rate, a suite of useful tools, flexible drive formats, and broad compatibility, making it an invaluable asset for professionals in the field.
| Specification | Details |
|---|---|
| Part Number | 785283-01 |
| Model | PXIe-6570 |
| Category | PXI Digital Instruments |
| Description | CCA, PATTERN BASED DIGITAL BASE BOARD |
| Vector Rate | 100 MVector/s |
| Application | Characterization and production tests of semiconductors |
| Tools Included | Digital Pattern Editor, Shmoo, digital scope, History RAM viewer, pin state viewer, framework state viewer |
| Drive Formats Supported | Non-return, return to low, return to high, surround by complement |
| Compatibility | RF and mixed signal integrated circuits testing on NI PXI platform and Semiconductor Test System (STS) |
Question 1: What is the vector rate of PXIe-6570?
Answer 1: 100 MVector/s.
Question 2: What tests is PXIe-6570 designed for?
Answer 2: Semiconductor characterization and production tests.
Question 3: What tools come with PXIe-6570?
Answer 3: Digital Pattern Editor, Shmoo, digital scope, and more.
Question 4: What are the PXIe-6570’s drive formats?
Answer 4: Non-return, return to low/high, surround by complement.
Question 5: Is PXIe-6570 compatible with RF testing?
Answer 5: Yes, and mixed-signal ICs on NI PXI platform.
