Description
The 785283-01 is a key component of the PXI Digital Instruments category, specifically the PXIe-6570 model. This advanced instrument is designed to provide a high vector rate of 100 MVector/s, making it an ideal choice for semiconductor characterization and production tests.
At the core of the PXIe-6570’s capabilities is the National Instruments PXIe-6570 PXI Digital Pattern Instrument, which is meticulously engineered for testing a wide array of RF and mixed-signal integrated circuits (ICs). This includes, but is not limited to, RF front ends, power management ICs, and transceivers. The instrument includes the Digital Pattern Editor, a powerful software tool that assists users in designing pin maps, specifications, levels, timing, and samples, thereby streamlining the testing process.
Moreover, the PXIe-6570 is equipped with an array of debugging tools to enhance the testing and development experience. These tools include Shmoo, digital scope, and viewers for History RAM, pin states, and framework states, providing comprehensive insights into the device under test (DUT). Such features are invaluable for engineers looking to quickly identify and resolve issues.
The compatibility of the PXIe-6570 extends to the NI PXI platform and the NI Semiconductor Test System (STS), ensuring a seamless integration into existing test environments. Furthermore, the instrument supports a variety of drive formats, including non-return, return to low, return to high, and surround by complement, offering flexibility in test setup and execution.
In summary, the National Instruments PXIe-6570 PXI Digital Pattern Instrument represents a pivotal advancement in semiconductor testing. Its robust feature set, combined with its compatibility and flexibility, makes it an indispensable tool for engineers focused on the characterization and production testing of RF and mixed-signal ICs.
| Part Number | 785283-01 |
|---|---|
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Vector Rate | 100 MVector/s |
| Description | National Instruments PXIe-6570 PXI Digital Pattern Instrument intended for semiconductor portrayal and production tests. Includes Digital Pattern Editor for design pin maps, specifications, levels, timing, and samples. Features debugging tools such as Shmoo, digital scope, and viewers for History RAM, pin states, and framework states. |
| Applications | Testing a wide range of RF and mixed signal integrated circuits (ICs), including RF front ends, power management ICs, and transceivers. |
| Compatibility | NI PXI platform and NI Semiconductor Test System (STS) |
| Drive Formats Supported | Non-return, return to low, return to high, and surround by complement |
Question 1: What is the vector rate of PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What software helps in designing pin maps for PXIe-6570?
Answer 2: Digital Pattern Editor
Question 3: Name a debugging tool available with PXIe-6570.
Answer 3: Shmoo
Question 4: Is the PXIe-6570 compatible with NI Semiconductor Test System?
Answer 4: Yes
Question 5: What IC types can PXIe-6570 test?
Answer 5: RF, power management ICs, transceivers
