Description
The PXIe-6570 is a state-of-the-art PXI Digital Instrument designed for sophisticated semiconductor characterization and production tests. With a part number of 158234A-02L and an alternative part number of 785283-01, this device falls under the category of PXI Digital Instruments, making it an essential component for testing RF and mixed signal integrated circuits (ICs).
One of the key features of the PXIe-6570 is its ability to deliver a maximum vector rate of 100 MVector/s, which ensures high-speed testing capabilities. This instrument is particularly useful in semiconductor characterization and production tests, where speed and accuracy are paramount.
The PXIe-6570 is equipped with an array of features designed to streamline the testing process. These include a Digital Pattern Editor, and several debugging tools such as Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, and Framework States Viewer. These tools are invaluable for diagnosing and resolving issues swiftly during the testing phase.
Supporting various drive formats such as Non-return, Return to Low, Return to High, and Surround by Complement, the PXIe-6570 offers flexibility in testing methodologies, allowing users to select the most appropriate format for their specific testing requirements.
Compatibility with the NI PXI Platform and the NI Semiconductor Test System (STS) ensures that the PXIe-6570 can be integrated seamlessly into existing testing frameworks, providing a versatile solution for a wide range of applications. This compatibility further enhances the utility of the PXIe-6570 in diverse testing environments.
In conclusion, the PXIe-6570 is a powerful and versatile digital instrument that is ideally suited for testing RF and mixed signal integrated circuits (ICs). Its comprehensive set of features and compatibility with established platforms make it an invaluable tool for professionals involved in semiconductor characterization and production tests.
| Specification | Details |
|---|---|
| Part Number | 158234A-02L |
| Alternative Part Number | 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Maximum Vector Rate | 100 MVector/s |
| Usage | Semiconductor characterization and production tests |
| Features | Digital Pattern Editor, Debugging Tools (Shmoo, Digital Scope, History RAM Viewer, Pin States Viewer, Framework States Viewer) |
| Drive Formats Supported | Non-return, Return to Low, Return to High, Surround by Complement |
| Application | Testing RF and mixed signal integrated circuits (ICs) |
| Compatible Platforms | NI PXI Platform, NI Semiconductor Test System (STS) |
Question 1: What is the max vector rate of the PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What is the main use of the PXIe-6570?
Answer 2: Semiconductor characterization and tests
Question 3: What kind of debugging tools does PXIe-6570 offer?
Answer 3: Shmoo, Digital Scope, History RAM Viewer
Question 4: Which platforms is the PXIe-6570 compatible with?
Answer 4: NI PXI Platform and NI Semiconductor Test System
Question 5: What are the drive formats supported by PXIe-6570?
Answer 5: Non-return, Return to Low, Return to High
