Description
The PXIe-6570 is a high-performance digital instrument that falls under the PXI Digital Instruments category, designed to meet the rigorous demands of semiconductor testing and production tests. With part numbers 158234C-02L and 785283-01, this module is equipped to handle a wide range of testing scenarios.
One of the key features of the PXIe-6570 is its impressive vector rate of 100 MVector/s, making it highly suitable for testing RF and mixed-signal integrated circuits (ICs). This capability ensures efficient and accurate testing, crucial for production environments where time and precision are of the essence.
The PXIe-6570 comes packed with advanced features that aid in the testing and debugging process. These include a Digital Pattern Editor, and various debugging tools such as Shmoo, digital scope, History RAM viewers, and pin/state viewers. These features are designed to simplify the testing process, allowing for quick identification and resolution of issues.
It supports various drive formats, including non-return, return to low, return to high, and surround by complement. This versatility ensures it can be adapted to a wide range of testing requirements and configurations, making it a flexible solution for different testing scenarios.
The PXIe-6570 is designed to work seamlessly on the NI PXI platform and the NI Semiconductor Test System (STS). This compatibility ensures that it can be easily integrated into existing testing setups, reducing the time and effort required for implementation and configuration.
In summary, the PXIe-6570 is a powerful tool for anyone involved in semiconductor testing or production tests, offering high-speed testing capabilities, versatile features, and ease of integration with leading platforms.
| Specification | Detail |
|---|---|
| Part Number | 158234C-02L, 785283-01 |
| Category | PXI Digital Instruments |
| Model | PXIe-6570 |
| Vector Rate | 100 MVector/s |
| Application | Semiconductor testing, production tests |
| Features | Digital Pattern Editor, Debugging Tools (Shmoo, digital scope, History RAM viewers, pin/state viewers) |
| Drive Formats Supported | Non-return, return to low, return to high, surround by complement |
| Platforms Supported | NI PXI platform, NI Semiconductor Test System (STS) |
| Suitable For | Testing RF and mixed signal integrated circuits (ICs) |
Question 1: What is the vector rate of the PXIe-6570?
Answer 1: 100 MVector/s
Question 2: What are two part numbers for the PXIe-6570?
Answer 2: 158234C-02L, 785283-01
Question 3: Name a debugging tool provided by PXIe-6570.
Answer 3: Digital Pattern Editor
Question 4: Can the PXIe-6570 integrate with the NI PXI platform?
Answer 4: Yes, it integrates seamlessly.
Question 5: What are the drive formats supported by the PXIe-6570?
Answer 5: Non-return, return to low/high, surround by complement
