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785283-01

The PXIe-6570 is a Digital Pattern Instrument with a 100 MVector/s rate, designed for semiconductor testing and includes a suite of tools.

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    Description

    The PXIe-6570 Digital Pattern Instrument, part number 785283-01, is a vital component in the category of PXI Digital Instruments. This model is specially designed to facilitate high-speed digital testing with its capability of handling 32 channels and achieving a vector rate of 100 MVector/s. It is primarily utilized in semiconductor testing and production tests, where precision and efficiency are paramount.

    One of the key features of the PXIe-6570 is its comprehensive suite of tools designed to enhance testing processes. These tools include the Digital Pattern Editor, Shmoo, digital scope, and viewers for History RAM, pin states, and framework states. Such an array of tools ensures that users can thoroughly analyze and debug digital circuits with ease and precision.

    Moreover, the PXIe-6570 supports various drive formats including Non-return, return to low, return to high, and surround by complement. This versatility allows it to adapt to a wide range of testing requirements and scenarios. The instrument is also highly compatible with RF and mixed signal integrated circuits (ICs), the NI PXI platform, and the NI Semiconductor Test System (STS). Such compatibility further extends its applicability across different testing environments and setups.

    In summary, the PXIe-6570 represents a powerful and versatile instrument within the field of digital testing, offering advanced features and tools to meet the rigorous demands of semiconductor testing and production tests.

    Specification Detail
    Part Number 785283-01
    Category PXI Digital Instruments
    Model PXIe-6570
    Description PXIe-6570 Digital Pattern Instrument, 32 CH
    Vector Rate 100 MVector/s
    Application Semiconductor testing, production tests
    Tools Included Digital Pattern Editor, Shmoo, digital scope, viewers for History RAM, pin states, and framework states
    Drive Formats Supported Non-return, return to low, return to high, surround by complement
    Compatibility RF and mixed signal integrated circuits (ICs), NI PXI platform, NI Semiconductor Test System (STS)

    Question 1: What is the part number of PXIe-6570?
    Answer 1: 785283-01

    Question 2: What is the vector rate of the PXIe-6570?
    Answer 2: 100 MVector/s

    Question 3: How many channels does PXIe-6570 support?
    Answer 3: 32 channels

    Question 4: What are some tools included with the PXIe-6570?
    Answer 4: Digital Pattern Editor, Shmoo, digital scope

    Question 5: Is the PXIe-6570 designed for semiconductor testing?
    Answer 5: Yes, primarily for semiconductor testing