The National Instruments PXIe-4137 PXI Source Measure Unit (Part Number: 783761-01) is a high-precision, customizable test instrument capable of delivering up to 500 W of power with a minimum pulse width of
The National Instruments PXIe-4137 PXI Source Measure Unit (Part Number: 783761-01) is designed to deliver a maximum instantaneous power of 500 W and is capable of generating minimum pulse widths of 50 microseconds, optimizing the testing process by minimizing the heating of the device under test (DUT), which reduces the need for thermal control systems.
With its SourceAdapt Control, the PXIe-4137 provides a custom-tunable response to different loads, ensuring system stability by eliminating oscillations and optimizing rise and fall times for the fastest possible test times. This makes the unit especially suitable for applications involving reactive loads, particularly capacitive loads.
The unit boasts high channel density, allowing the creation of parallel SMU test systems, and features deterministic hardware sequencing to minimize software overhead, coupled with high-speed test rates for quickly changing setpoints and acquiring data. The flexible sampling rate and streaming capability of the PXIe-4137 also enable it to function as a digitizer, capturing transient behavior, while the digital control loop allows users to adjust the transient response of the instrument to meet specific testing requirements.
Specification
Detail
Product Name
National Instruments PXIe-4137 PXI Source Measure Unit
Part Number
783761-01
Maximum Instantaneous Power
500 W
Minimum Pulse Width
50 microseconds
SourceAdapt Control
Custom-tunable response for different loads
Thermal Control Systems Requirement
Minimal, with short pulse widths to reduce DUT heating
Oscillation Elimination
For system stability
Rise and Fall Times
Optimized for fast test times
Application Suitability
Reactive loads, especially capacitive loads
Channel Density
High, for parallel SMU test systems
Hardware Sequencing
Deterministic, to minimize software overhead
High-Speed Test Rates
For rapidly changing setpoints and data acquisition
Sampling Rate
Flexible, with streaming capability
Transient Behavior Capture
Can be used as a digitizer
Digital Control Loop
Enables user to adjust transient response of the instrument
Question 1: What are the benefits of the National Instruments PXIe-4137’s SourceAdapt Control when testing systems with reactive capacitive loads? Answer 1: The SourceAdapt Control of the National Instruments PXIe-4137 benefits testing systems with reactive capacitive loads by custom-tuning the response to different load types, ensuring system stability by eliminating oscillations, and optimizing rise and fall times for the fastest possible test times.
Question 2: What specific features of the National Instruments PXIe-4137 PXI Source Measure Unit make it suitable for testing devices with minimal thermal impact and for applications involving capacitive loads? Answer 2: The National Instruments PXIe-4137 PXI Source Measure Unit is suitable for testing devices with minimal thermal impact due to its capability to generate minimum pulse widths of 50 microseconds, which minimizes heating of the device under test, and for applications involving capacitive loads due to its SourceAdapt Control that provides a custom-tunable response to different loads, ensuring system stability and optimizing test times.
Question 3: What is the significance of the SourceAdapt Control in the National Instruments PXIe-4137 PXI Source Measure Unit when testing with reactive, particularly capacitive, loads? Answer 3: The advantages of the National Instruments PXIe-4137 SMU’s SourceAdapt Control when testing with reactive, particularly capacitive loads, include the ability to custom-tune the response to different load types, which ensures system stability by eliminating oscillations and optimizing rise and fall times, resulting in the fastest possible test times for such loads.
Question 4: What is the advantage of the National Instruments PXIe-4137 PXI Source Measure Unit’s ability to generate minimum pulse widths of 50 microseconds in the context of device under test (DUT) thermal management? Answer 4: The SourceAdapt Control in the National Instruments PXIe-4137 PXI Source Measure Unit is significant for testing with reactive, particularly capacitive, loads because it offers a custom-tunable response that ensures system stability by eliminating oscillations and optimizing rise and fall times, which leads to the fastest possible test times for such applications.
Question 5: What are the advantages of the National Instruments PXIe-4137 SMU’s SourceAdapt Control when testing with reactive, particularly capacitive loads? Answer 5: The National Instruments PXIe-4137 PXI Source Measure Unit’s ability to generate minimum pulse widths of 50 microseconds provides the advantage of minimizing the heating of the device under test (DUT), thereby reducing the need for extensive thermal control systems during the testing process.
