Description
The National Instruments PXIe-4145 PXI Source Measure Unit, denoted by part number 782435-01, is an integral component of the Wireless IC Test PXI Solution aimed at RFIC testing. This system solution is equipped with an array of key features, including an Error Vector Module (EVM), System Leak, Frequency Offset, and various Custom Calibration Schemes such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM, designed to facilitate comprehensive RFIC device assessments.
It boasts compatibility with NI LabVIEW software, allowing users to tailor their system to perform precise measurements that are crucial for characterizing their wireless ICs. The Analog Office Function offers an RFIC Design Environment, complete with the innovative Unified Data Model™, which enhances the design process by ensuring simultaneous strategy execution that is responsive to RF interconnection requirements.
Furthermore, its foundation on an open high-frequency design platform allows seamless integration of RFIC design technology, ranging from system-level implementation to the final output stages. The PXIe-4145 addresses both active and passive devices, as well as interconnections at high frequencies, thereby enabling accurate modeling and extraction, which in turn accelerates product development and market launch timelines.
| Specification | Detail |
|---|---|
| Product Name | National Instruments PXIe-4145 PXI Source Measure Unit |
| Part Number | 782435-01 |
| System Solution | Wireless IC Test PXI Solution (RFIC) |
| Key Features | Error Vector Module (EVM), System Leak, Frequency Offset, Custom Calibration Schemes (AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, QAM) |
| Software Compatibility | NI LabVIEW |
| Analog Office Function | RFIC Design Environment with Unified Data Model™ |
| Integration Platform | Open high-frequency design platform |
| Design Components | Active and passive devices, and interconnections at high frequency |
Question 1: What capabilities does the National Instruments PXIe-4145 PXI Source Measure Unit offer for RFIC testing and how does it integrate with NI LabVIEW to enhance RFIC design and accelerate product development processes?
Answer 1: The National Instruments PXIe-4145 PXI Source Measure Unit is a key component of the Wireless IC Test PXI Solution, facilitating RFIC testing with features such as EVM, System Leak, and Frequency Offset, and supporting custom calibration schemes for precise device assessments; its compatibility with NI LabVIEW software and integration into the Analog Office Function’s RFIC Design Environment with the Unified Data Model™ allows for tailored measurements and design strategies that meet RF interconnection requirements, thus enhancing the RFIC testing
Question 2: What is the role of the National Instruments PXIe-4145 PXI Source Measure Unit within the Wireless IC Test PXI Solution, and how does it enhance RFIC testing and design processes?
Answer 2: The National Instruments PXIe-4145 PXI Source Measure Unit, part number 782435-01, is designed for RFIC testing and includes capabilities for Error Vector Module (EVM) analysis, System Leak detection, Frequency Offset measurement, and supports Custom Calibration Schemes such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM; it is also compatible with NI LabVIEW software
Question 3: What are the capabilities and advantages of using the National Instruments PXIe-4145 PXI Source Measure Unit, part number 782435-01, in RFIC testing environments?
Answer 3: The National Instruments PXIe-4145 PXI Source Measure Unit offers a comprehensive suite of RFIC testing capabilities, including an Error Vector Module, System Leak, Frequency Offset, and various Custom Calibration Schemes like AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM, all of which enable detailed assessments of RFIC devices. Its integration with NI LabVIEW software allows users to customize their systems
Question 4: What features and capabilities does the National Instruments PXIe-4145 PXI Source Measure Unit offer for RFIC testing, and how does it integrate with NI LabVIEW and RFIC design environments to enhance wireless IC characterizations?
Answer 4: The National Instruments PXIe-4145 PXI Source Measure Unit offers features such as an Error Vector Module (EVM), System Leak, Frequency Offset, and Custom Calibration Schemes for various modulation types to facilitate comprehensive RFIC device assessments, and integrates with NI LabVIEW software, allowing for tailored measurements crucial for characterizing wireless ICs, while its compatibility with the Analog Office Function and Unified Data Model™ provides an RFIC Design Environment that supports an open high-frequency design platform, enabling precise modeling
Question 5: What are the specific RFIC assessment capabilities and compatibility features of the National Instruments PXIe-4145 PXI Source Measure Unit with part number 782435-01?
Answer 5: The National Instruments PXIe-4145 PXI Source Measure Unit, part number 782435-01, is designed for RFIC testing and offers capabilities such as Error Vector Module (EVM), System Leak, Frequency Offset, and various Custom Calibration Schemes including modulation formats like AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM, which enable comprehensive RFIC device assessments; its compatibility
