PXIe-5172

Description

The National Instruments PXIe-5172 is an advanced High-Density Oscilloscope that boasts a range of part numbers including 784224-01, 784225-01, and 784226-01. It utilizes the Measurement and Automation Explorer (MAX) as its software configuration tool, along with NI-SCOPE driver software to ensure efficient operation and interfacing. This oscilloscope is remotely aligned at the factory to guarantee precision from the start.

Users should note that there are specific circumstances under which a self-alignment should be performed: this includes after the first installation in a chassis, subsequent to installing, uninstalling, or moving any frame module, when there are significant ambient temperature shifts or changes greater than ± 5 °C from the last auto-calibration, and to make periodic adjustments for yield drifts that naturally occur as the product ages.

Data transfer within this oscilloscope is facilitated by the JESD204B high-speed serial interface, and it is powered by a Xilinx FPGA, which is renowned for its low-cost and high-performance characteristics. Additionally, this device is designed to work with Automated Test Equipment (ATE) capabilities, enabling it to sequence through Device Under Test (DUT) modes and adapt settings based on the measurement values obtained.

Question 1: What are the specific conditions that necessitate a self-alignment on the National Instruments PXIe-5172 oscilloscope, such as after initial installation or changes in ambient temperature?
Answer 1: A self-alignment on the National Instruments PXIe-5172 High-Density Oscilloscope should be performed after its first installation in a chassis, after installing, uninstalling, or moving any frame module, when there is an ambient temperature shift of more than ± 5 °C from the last auto-calibration, and periodically to adjust for yield drifts as the product ages.

Question 2: What are the specific conditions under which a self-alignment should be executed on the National Instruments PXIe-5172 High-Density Oscilloscope?
Answer 2: A self-alignment should be executed on the National Instruments PXIe-5172 High-Density Oscilloscope after its first installation in a chassis, when a module is installed, uninstalled, or moved, if ambient temperature shifts more than ± 5 °C from the last auto-calibration, or to address periodic adjustments for component drift as the product ages.

Question 3: What are the recommended circumstances under which a self-alignment should be performed on the National Instruments PXIe-5172 High-Density Oscilloscope?
Answer 3: A self-alignment on the National Instruments PXIe-5172 High-Density Oscilloscope should be performed after the first installation in a chassis, when installing, uninstalling, or moving any frame module, if there are ambient temperature shifts greater than ± 5 °C from the last auto-calibration, and periodically to adjust for yield drifts as the product ages.

Question 4: Under what specific circumstances should a user perform a self-alignment on the National Instruments PXIe-5172 High-Density Oscilloscope?
Answer 4: A user should perform a self-alignment on the National Instruments PXIe-5172 High-Density Oscilloscope after its first installation in a chassis, if any frame modules are installed, uninstalled, or moved, when ambient temperature shifts by more than ± 5 °C from the last calibration, and periodically to adjust for natural yield drifts as the product ages.

Question 5: What specific circumstances necessitate performing a self-alignment on the National Instruments PXIe-5172 High-Density Oscilloscope?
Answer 5: A self-alignment on the National Instruments PXIe-5172 oscilloscope is required after the first installation in a chassis, when installing, uninstalling, or moving any frame module, following significant ambient temperature shifts greater than ± 5 °C from the last auto-calibration, and to compensate for periodic adjustments due to yield drifts as the product ages.