The National Instruments PXIe-6547 PXI Digital Waveform Instrument features a 200 MHz bandwidth with 32 channels, up to 200 MHz sampling rate, programmable voltage levels with 100 mV resolution, and advanced synchronization capabilities including
The National Instruments PXIe-6547 PXI Digital Waveform Instrument, with part numbers 781011-01, 781011-02, 781011-03, and 199552B-02L, is a high-performance testing solution that boasts a 200 MHz bandwidth across 32 channels. It is capable of sampling digital waveforms at rates up to 200 MHz, while offering programmable voltage levels with a fine resolution of 100 mV, allowing for precise adjustments to meet various testing requirements.
One of the key features of the PXIe-6547 is its advanced synchronization capabilities, essential for constructing integrated mixed signal test systems. The instrument includes hardware comparison functions that are particularly useful for conducting bit error tests. Additionally, it provides digital timing features for each bank, enhancing its versatility and control in complex testing scenarios.
Equipped with an onboard direct digital synthesis (DDS) clock, the PXIe-6547 achieves subhertz resolution up to 200 MHz, which enables more precise clocking of data acquisition or generation without the need for an external clock source. Clock sharing is possible over the PXI backplane or through an SMA connector located on the front panel, further extending the device’s synchronization options.
Furthermore, the device can receive an external clock input via the front panel or backplane, adding flexibility for users who require external timing references. At its core, the PXIe-6547 is built upon the Synchronization and Memory Core (SMC), which facilitates synchronization with other SMC-based devices using the NI-TCLK API, enabling sub-nanosecond precision when synchronizing multiple devices. This makes it possible to create highly synchronized, high-channel-count systems within a PXI Express chassis.
Specification
Detail
Product Name
National Instruments PXIe-6547 PXI Digital Waveform Instrument
Part Numbers
781011-01, 781011-02, 781011-03, 199552B-02L
Bandwidth
200 MHz
Channels
32 Channels
Sampling Rate
Up to 200 MHz
Programmable Voltage Levels
Resolution of 100 mV
Advanced Synchronization Capabilities
Yes, for integrated mixed signal test systems
Hardware Comparison
For bit error testing
Digital Timing Features
Per bank
Onboard Clock
Direct digital synthesis (DDS) with subhertz resolution up to 200 MHz
Clock Sharing
Over PXI backplane or through SMA connector
External Clock Input
Via the front panel or backplane
Synchronization and Memory Core (SMC)
Yes, enables synchronization with other SMC-based devices using NI-TCLK API
Sub-Nanosecond Synchronization
Yes, for multiple devices
Question 1: What are the capabilities of the National Instruments PXIe-6547 PXI Digital Waveform Instrument in terms of bandwidth, channel count, and synchronization features? Answer 1: The onboard direct digital synthesis (DDS) clock of the National Instruments PXIe-6547 offers advantages for data acquisition or generation by enabling subhertz resolution up to 200 MHz for more precise timing, eliminating the need for an external clock source, and allowing for enhanced synchronization capabilities through clock sharing over the PXI backplane or via an SMA connector, thus providing users with increased accuracy and flexibility in their testing setups.
Question 2: What advanced synchronization features does the National Instruments PXIe-6547 offer for constructing integrated mixed signal test systems, and how do they contribute to its precision and control in complex testing scenarios? Answer 2: The National Instruments PXIe-6547 PXI Digital Waveform Instrument offers a bandwidth of 200 MHz across 32 channels, and it features advanced synchronization capabilities, including an onboard direct digital synthesis clock for subhertz resolution, hardware comparison functions for bit error testing, digital timing features for each bank, and the ability to synchronize with other SMC-based devices using the NI-TCLK API for sub-nanosecond precision, making it ideal for constructing integrated high-channel-count mixed signal test systems
Question 3: What are the intrinsic synchronization features of the National Instruments PXIe-6547 PXI Digital Waveform Instrument that make it suitable for constructing integrated mixed signal test systems? Answer 3: The intrinsic synchronization features of the National Instruments PXIe-6547 PXI Digital Waveform Instrument that make it suitable for constructing integrated mixed signal test systems include its advanced synchronization capabilities, hardware comparison functions for bit error rate testing, digital timing features for each bank, an onboard direct digital synthesis (DDS) clock for precise clocking up to 200 MHz, clock sharing over the PXI backplane or through an SMA connector, and the integration with the Synchronization and Memory Core (SMC)
Question 4: What are the advantages of using the onboard direct digital synthesis clock of the National Instruments PXIe-6547 for data acquisition or generation in comparison to relying on an external clock source? Answer 4: The National Instruments PXIe-6547 offers advanced synchronization features such as an onboard direct digital synthesis (DDS) clock for subhertz resolution up to 200 MHz, hardware comparison functions for bit error testing, and digital timing features for each bank, all of which contribute to its precision and control in complex testing scenarios by enabling highly synchronized, high-channel-count systems within a PXI Express chassis, and allowing precise clocking of data acquisition or generation without an external clock source.
Question 5: What are the capabilities and unique features of the National Instruments PXIe-6547 PXI Digital Waveform Instrument that make it suitable for constructing integrated mixed-signal test systems? Answer 5: The National Instruments PXIe-6547 PXI Digital Waveform Instrument is suitable for constructing integrated mixed-signal test systems due to its 200 MHz bandwidth across 32 channels, ability to sample digital waveforms at rates up to 200 MHz, programmable voltage levels with 100 mV resolution, advanced synchronization capabilities, hardware comparison functions for bit error testing, digital timing features for each bank, an onboard DDS clock for precise clocking up to 200 MHz, and synchronization with other S
