TDS3054B – Tektronix

Description

Item #: TDS3054B

Manufacturer: Tektronix
Series: TDS3000B

TDS3054B by Tektronix is a Digital Phosphor Oscilloscope in the TDS3000B series. TDS3054B features 4 Channels and a Bandwidth of 500 MHz.

The Tektronix TDS3054B Digital Phosphor Oscilloscope has an astounding constant 3,600 wfms/s waveform capture rate to catch errors and intermittent events at three times the speed of other oscilloscopes. The ability to provide these quick waveform capture rates on an ongoing basis saves hours and possibly even days of time because the errors are revealed so quickly. Once the errors are revealed, advanced triggers can pinpoint them and single them out. Additionally, the TDS3054B’s real-time intensity grading highlights the specifics about a signal’s past activity, which makes it simpler to comprehend the characteristics of the captured waveforms.

The 500 MHz bandwidth on the Tektronix TDS3054B Digital Phosphor Oscilloscope allows the signal to be more precise. The high bandwidth on this oscilloscope can withstand even the most challenging projects, enabling the user to finish their tasks competently and in a timely manner. The TDS3054B Digital Phosphor Oscilloscope has versatile, optional application modules, which help make it a useful tool for video troubleshooting, limit testing, and telecommunications mask testing. For example, the TDS3AM Advanced Analysis Module provides advanced waveform math, while the TDS3LIM Limit Testing Module delivers quick, precise Go/No Go confirmation that tested circuits are running as they should be.

The Tektronix TDS3054B uses a combination of digital real-time (DRT) sampling technology and sin(x)/x interpolation to enable the user to precisely characterize a variety of signal types on every channel at the same time. This sampling technology permits the oscilloscope to capture high-frequency data, including glitches and edge irregularities, which normally cannot be captured by similar oscilloscopes. Sin(x)/x interpolation guarantees exact reconstruction of every waveform. The outcome is a full look at the signal to improve speed with debug and characterization.

Specifications